PXle, 18 slots (9 PXI slots, 4 hybrid slots, 3 PXI Express slots, 1 PXI Express System timing slot), up to 3 GB/s PXI chassis - The PXLE-1065 is designed for a variety of test and measurement applications. And provide a high-bandwidth backplane. The NI PXle-1065 has nine PXI peripheral slots, one PXIExpress slot with system timing, three PXIExpress slots, and four hybrid slots supporting PXI and PXIExpress peripheral modules.
The PXIe-1065 is a high-performance chassis with a variety of functions and features.
First, it has a high-bandwidth backplane with up to 1 GB/s dedicated bandwidth (x4 PCIe) per PXI high-speed slot, for a total system bandwidth of more than 3GB/s, which enables it to meet a variety of high-performance test needs.
Secondly, the PXIe-1065 chassis operates in the temperature range of 0°C to 55°C, and when the temperature is below 30°C, it can also control the noise at 43.6dBA, ensuring a good working environment and low noise interference.

In addition, the PXY-1065 chassis has multiple slots, including nine PXI peripheral slots, one PXI Express slot with system timing, three PXI Express slots, and four hybrid slots supporting PXI and PXI Express peripheral modules. These slots can accept PXI and PXIExpress modules and have features such as a built-in reference clock, trigger bus, and star trigger.
The PXIe-1065 case is also equipped with a variable speed fan controller that optimizes cooling and noise emissions, as well as remote power suppression control. In addition, the chassis offers optional features such as front and rear rack mounting kits, replacement power shuttles, EMC fill panels, and slot flaps to optimize cooling performance.
Finally, the PXIe-1065 chassis can be used in combination with FPGA modules such as the PXIe-7966R and RF adapter modules such as the NI-5792 to provide high-performance analog and digital I/O ports to form a reconfigurable instrument that is programmed with LabVIEW FPGA software to achieve the desired functionality.
In conclusion, the PXIe-1065 chassis features high performance, high reliability, multi-slot support, optimized cooling and noise control, and is suitable for a variety of high-performance testing and application needs.

